v.22.6Improvement

Improve Short Circuit Functions Processing for Stress Test Issues

Try to improve short circuit functions processing to fix problems with stress tests. #37384 (Kruglov Pavel).
Improved processing of short-circuit functions to enhance reliability during stress tests.

Why it matters

This feature addresses issues encountered with the execution of short-circuit functions under heavy load or stress testing conditions, ensuring more stable and predictable query behavior.

How to use it

The improvements are integrated internally and applied automatically; users benefit from enhanced short-circuit function processing without needing to change query syntax or enable specific settings.